This is actually one of two systems at John Carroll. The second is an AutoProbe SA, which operates by scanning the probe tip over the sample, rather the scanning the sample beneath the probe tip. This second system is ideally suited for larger materials samples. For example, one could examine the microstructure of a whole silicon wafer, without cutting it up first.
This is a view of the main system (the electronics and computer system are not shown).
This is a close up of the AFM head viewed both from the top and the front.
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